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Information × Registration Number 2115U002136, Article popup.category Thesis Title popup.author popup.publication 01-01-2015 popup.source_user Сумський державний університет popup.source http://essuir.sumdu.edu.ua/handle/123456789/42719 popup.publisher Sumy State University Description The films were deposited by magnetron sputtering the AlMgB14 target at different substrate temperatures (TS) in the range of 100-500 C. The films were annealed at 1000 C in vacuum. The deposited films were characterized by XRD, AFM, FTIR spectroscopy, nano- and micro-indentation and scratch testing. The films exhibit hardness that is much lower than the one of the bulk AlMgB14 materials, which is due to the amorphous film structure in which the strong B-B bonds are absent and the weaker B-O bonds dominate. popup.nrat_date 2025-05-12 Close