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Information × Registration Number 2115U002201, Article popup.category Thesis Title popup.author popup.publication 01-01-2015 popup.source_user Сумський державний університет popup.source http://essuir.sumdu.edu.ua/handle/123456789/41238 popup.publisher Sumy State University Description In the electronics low-frequency noise is often used for reliability estimation of semiconductor devices. Spectral power density of this noise proportional to 1/ f, where γ is the spectral exponent. In [1] shown, that for spectral analysis of non-white noise exists optimum resolution bandwidth. Total mean square error of the estimate is minimal when analysis filter bandwidth is optimum. In [1] it is shown that DFT could be represented as result of processing by filters with different bandwidths by means of frequency averaging. popup.nrat_date 2025-05-12 Close