Search academic texts

Information × Registration Number 2116U001732, Article popup.category Thesis Title popup.author popup.publication 01-01-2016 popup.source_user Сумський державний університет popup.source http://essuir.sumdu.edu.ua/handle/123456789/45973 popup.publisher Sumy State University Description In the electronics low-frequency (LF) noise often used for reliability estimation of semiconductor devices. Spectral exponent of noise may be used as an informative parameter. The simplest method of exponent measurement is to measure power spectral density (PSD) of noise on two frequencies. popup.nrat_date 2025-05-12 Close