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Information × Registration Number 2116U001791, Article popup.category Стаття Title popup.author popup.publication 01-01-2016 popup.source_user Сумський державний університет popup.source http://essuir.sumdu.edu.ua/handle/123456789/46175 popup.publisher Journal of Alloys and Compounds Description New approach for deposition of Cd1−xZnxTe thick films has been developed. Effect of chemical composition on Cd1−xZnxTe thick films properties was studied. The proposed approach allows obtaining of high-quality Cd1−xZnxTe thick films. Compositional dependence of Raman modes frequencies was established. This paper reports the results of structural, photoluminescence and Raman characterization of thick Cd1−xZnxTe films with different zinc concentration obtained by the close spaced vacuum sublimation method. The analysis of the X-rays patterns allows us to determine the effect of the zinc concentration on crystal quality of the films. It was found that samples with x ≈ 0.10 and x ≈ 0.32 have high crystal quality. However, with increasing of zinc concentration the crystal quality decreases. This result was confirmed by the photoluminescence study. Namely, the significant degradation of optical properties for the samples with high zinc concentration (x > 0.32) was observed. Raman spectroscopy reveals the relation between zinc concentration and vibrational properties of the films. Also, the micro-Raman method shows that obtained films are uniform and free of tellurium inclusions. popup.nrat_date 2025-05-12 Close