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Information × Registration Number 2118U002141, Article popup.category Стаття Title popup.author popup.publication 01-01-2018 popup.source_user Сумський державний університет popup.source http://essuir.sumdu.edu.ua/handle/123456789/69283 popup.publisher Sumy State University Description Single crystal thin films of CdS were grown onto glass substrates by RF magnetron sputtering at var ious substrate temperatures. Structural, optical and morphology properties of these films were investigated through low angle XRD, Raman spectroscopy, scanning electron microscopy (SEM), energy dispersive x-ray (EDX) spectroscopy, UV-Visible spectroscopy etc. Formation of single crystal CdS films has been confirmed by low angle XRD and Raman spectroscopy analysis. Low angle XRD showed that CdS films has preferred orientation in (111) direction. Improvement of crystallinity and increase in average grain size of CdS crystallites has been observed with increase in substrate temperature. Surface morphology investigated using SEM showed that CdS films deposited over entire range of substrate temperature are highly smooth, dense, homogeneous, and free of flaws and cracks. The EDX data revealed the formation of high-quality nearly stoichiometric CdS films by RF magnetron sputtering. Furthermore, the CdS films deposited at low substrate temperatures (< 200 0C) are slightly S rich while deposited at higher substrate temperatures (> 200 0C) are slightly Cd rich. The UV-Visible spectroscopy analysis showed that an average transmission ~ 80-90 % in the visible range of the spectrum having band gap ~ 2.28 -2.38 eV, which is quite close to the optimum value of band gap for a buffer layer in CdTe/CdS, Cu2S/CdS hetero-junction solar cells. popup.nrat_date 2025-03-24 Close