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Information × Registration Number 2118U002172, Article popup.category Стаття Title popup.author popup.publication 01-01-2018 popup.source_user Сумський державний університет popup.source http://essuir.sumdu.edu.ua/handle/123456789/68636 popup.publisher Sumy State University Description The influence of doping degree on the structural characteristics of bismuth films doped with tellurium in the concentration range 0.005-0.150 at. % Te and the thickness range 0.3-0.7 µm is studied at present article. Authors have established that an increase of the doping degree with tellurium in bismuth films leads to a significant decreasing of the growth figures. The weak influence of annealing on the crystallite size of bismuth films doped with tellurium indicates their high temporal stability of the structure. popup.nrat_date 2025-03-24 Close