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Information × Registration Number 2121U005132, Article popup.category Стаття Title popup.author popup.publication 01-01-2021 popup.source_user Сумський державний університет popup.source https://essuir.sumdu.edu.ua/handle/123456789/84695 popup.publisher Department of Physics and Astronomy of the National Academy of Sciences of Ukraine Description he epitaxial growth of thin films with regard for the anisotropy of the adsorbate surface dif-fusion induced by electromigration effects has been studied theoretically in the framework ofthe phase-field theory and with the use of numerical simulations. The influence of the coef-ficient of electromigration-induced anisotropic diffusion, which is proportional to the appliedelectric field strength, on the dynamics of growth of the film thickness and the height of sur-face structures, growing surface morphology, statistical characteristics of the surface multilayeradsorbate structures, and distribution of surface structures over their heights is revealed. popup.nrat_date 2025-05-12 Close