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Head: Бердар Микола Миколайович. Theoretical and experimental researches by the method of scanning probe microscopy of the atomic structure of thin oxides layers which are the elements of the applied structures. Development and optimization of methods of implantation of the Si+ low-energetic ions in the structure of the SіO2 nanothin thermal oxides on monocrystal silicon substrate..
. № 0104U010879
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Updated: 2026-03-22
