1 documents found
Head: Деркач Вадим Миколайович. Development of the near-field microscopy methods and devices for investigation of properties and structure of new semiconductors, dielectrics and nanomaterials in gigahertz and terahertz frequency bands.
O. Ya. Usikov Institute for Radiophysics and Electronics NAS of Ukraine. № 0107U005174
1 documents found
Updated: 2026-03-21
