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Information × Registration Number 0110U004655, ( 0211U001351  0212U001291  0213U000163  0214U001027  0214U005447  ) R & D request Title Development and progress of method of submicron topography and passport systems of chemical composition, structural perfection, electrophysics parameters and strain distributing in the nanostructures of electronics and optoelectronics. Head Strelchuk Viktor , Доктор фізико-математичних наук Registration Date 26-04-2012 Organization V. Lashkaryov Institute of semiconductor physics popup.description1 popup.nrat_date 2024-12-10 Close
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Development and progress of method of submicron topography and passport systems of chemical composition, structural perfection, electrophysics parameters and strain distributing in the nanostructures of electronics and optoelectronics.
Head: Strelchuk Viktor . Development and progress of method of submicron topography and passport systems of chemical composition, structural perfection, electrophysics parameters and strain distributing in the nanostructures of electronics and optoelectronics.. V. Lashkaryov Institute of semiconductor physics. № 0110U004655
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Updated: 2026-03-24


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