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Information × Registration Number 0115U002989, R & D request Title Development diffractometry and research methods reflektometrychnyh structural properties of semiconductor and hybrid systems of low dimension. Head Кладько Василь Петрович, Registration Date 11-04-2015 Organization V. Lashkaryov Institute of semiconductor physics popup.description1 popup.nrat_date 2024-12-10 Close
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Development diffractometry and research methods reflektometrychnyh structural properties of semiconductor and hybrid systems of low dimension.
Head: Кладько Василь Петрович. Development diffractometry and research methods reflektometrychnyh structural properties of semiconductor and hybrid systems of low dimension.. V. Lashkaryov Institute of semiconductor physics. № 0115U002989
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Updated: 2026-03-25


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