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Information × Registration Number 0118U006100, R & D request Title Development of experimental technique for the analysis of the distribution of thermal fields with ultrahigh resolution in multilayered film structures. Head Голенков Олександр Геннадійович, Registration Date 28-08-2018 Organization V. Lashkaryov Institute of semiconductor physics popup.description1 popup.nrat_date 2024-12-10 Close
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Development of experimental technique for the analysis of the distribution of thermal fields with ultrahigh resolution in multilayered film structures.
Head: Голенков Олександр Геннадійович. Development of experimental technique for the analysis of the distribution of thermal fields with ultrahigh resolution in multilayered film structures.. V. Lashkaryov Institute of semiconductor physics. № 0118U006100
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Updated: 2026-03-22


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