1 documents found
Registration Number

0118U006100, R & D request

Title

Development of experimental technique for the analysis of the distribution of thermal fields with ultrahigh resolution in multilayered film structures.

Head

Голенков Олександр Геннадійович,

Registration Date

28-08-2018

Organization

V. Lashkaryov Institute of semiconductor physics

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2024-12-10

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Development of experimental technique for the analysis of the distribution of thermal fields with ultrahigh resolution in multilayered film structures.
Head: Голенков Олександр Геннадійович. Development of experimental technique for the analysis of the distribution of thermal fields with ultrahigh resolution in multilayered film structures.. V. Lashkaryov Institute of semiconductor physics. № 0118U006100
1 documents found

Updated: 2025-11-14


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