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Information × Registration Number 0203U008161, 0100U002891 , R & D reports Title Influence of external factors and of electric regimes on the failure behaviour characteristics of semiconductor structures and development of methodology for their accelerated realibility tests. popup.stage_title Head Kurmashev Sh.D., Registration Date 02-06-2003 Organization Odessa I.I.Mechnikov's National University popup.description2 The influence of external factors on failure behaviour of semiconductor structures is investigated. The models are degradation developed. The method for the accelerated reliability tests is developed and formulas for recalculation of the forced-regime test results info the normal regime are proposed. The experimental verification of the methods is carried out. Product Description popup.authors popup.nrat_date 2020-04-02 Close