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Information × Registration Number 0204U000613, 0101U008200 , R & D reports Title Two- and multiple X- ray difractometry of thin layers and nanostructure popup.stage_title Head Raransky N.D., Registration Date 16-02-2004 Organization Yuri Fedkovych Chernivtsi National University popup.description2 The objects of research are Si crystals, multilayered nanoscaled structures, GaAs crystals with surfaces of assigned submicron relief. The process of main components interdiffusion near the interfaces in multilayered nanoscaled structures containing one or two quantum wells were under investigation. The new techniques for determination of roughness parameters of solids surface were developed using the methods of two- and three -crustal reflectometry. During the process of natural ageing the correlation was established between integrated characteristics of X-rays dynamical scatterind, temperature spectra of absorbed elastic power and changes in the defect structure of silicon crystal irradiated by high - energy electrons and gamma quanta. Product Description popup.authors popup.nrat_date 2020-04-02 Close