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Information × Registration Number 0205U000216, 0104U004871 , R & D reports Title Information and computer technologies in diagnostics of materials popup.stage_title Head Molodkin Vadim Borysovych, Registration Date 19-01-2005 Organization Institute for metal physics NAS Ukkraine popup.description2 The theoretical model is proposed and the integrated-diffractometry methods are developed for determination of the quantitative characteristics of the disturbed surface layers and randomly distributed defects (RDD), which are simultaneously presented in crystals. For the first time, the presence of the diffuse-scattering integrated-intensity dependence on the uniform macroscopic-deformation degree is proved experimentally. For the first time, this one gives the possibility of the reliable quantitative determination of the RRD characteristics by the simulation and fitting of the experimental TIRP-deformation dependences. Theoretical and experimental bases of high-resolution X-ray double-crystal diffractometry of nanodimensional multilayered systems with quantum well and processes mutual diffusions of atoms of components and relaxations of strain between layers are developed. Product Description popup.authors popup.nrat_date 2020-04-02 Close