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Information × Registration Number 0205U006476, 0104U010073 , R & D reports Title The complex of methods development for practical diagnostic and support of modern technologies for nanostructures production with specified physical and physico-chemical parameters and characteristics. popup.stage_title Head Prokopenko Igor V., Registration Date 15-11-2005 Organization Institute of Semiconductor Physics of National Academy of Sciences of Ukrain popup.description2 Theoretical analysis of the X-ray diffraction peculiarities in semiconductor superlattice structures containing quantum dots has been curried out. X-ray technique for nondestructive composition analysis of semiconductor nanostructures was improved. Product Description popup.authors popup.nrat_date 2020-04-02 Close