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Information × Registration Number 0207U000833, 0104U010929 , R & D reports Title New physical principles of diffraction topography of crystal defects popup.stage_title Head Fodchuk Igor, Registration Date 09-02-2007 Organization Yuri Fedkovych Chernivtsi National University popup.description2 The new original devices for standard X-ray facilities as well as techniques are de-veloped for carrying out of X-ray topographical investigations with symmetric and skew asymmetric arrangement of X-ray diffraction in the range of total external re-flection angels and realization of two-crystal spectrometer method. The mecha-nisms and regularities of X-ray intensity distribution forming in crystals with strained subsurface layers. Product Description popup.authors popup.nrat_date 2020-04-02 Close