Registration Number
0207U000833,
0104U010929
, R & D reports
Title
New physical principles of diffraction topography of crystal defects
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Head
Fodchuk Igor,
Registration Date
09-02-2007
Organization
Yuri Fedkovych Chernivtsi National University
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The new original devices for standard X-ray facilities as well as techniques are de-veloped for carrying out of X-ray topographical investigations with symmetric and skew asymmetric arrangement of X-ray diffraction in the range of total external re-flection angels and realization of two-crystal spectrometer method. The mecha-nisms and regularities of X-ray intensity distribution forming in crystals with strained subsurface layers.
Product Description
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2020-04-02
