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Information × Registration Number 0208U000875, 0107U005765 , R & D reports Title Creation and certification of etalon series of single crystal samples and realization of the methods of fast measurements of the value of integral dispersion of emission in germanium crystals popup.stage_title Head Pekar Grygoriy Solomonovych, Registration Date 21-02-2008 Organization Institute of Semiconductor Physics of NAS of Ukraine popup.description2 The method for the express high-informative quality diagnostics of the volume optical germanium single crystals by measuring the dispersion of infrared radiation at the wave length from 2 to 11мm is developed and realized. The new generation components (those are the high-sensitivity and high-resolution devices) as well as the high-performance computers have been used for creating the measuring equipment. In addition, the mechanical drives was not used. As a result, each cycle of measurements became dozens of times shorter without accuracy loss, and the information obtained is increased, in particular, the spatial dispersion could be measured. By using the original technological method of optical germanium crystal growing, the series of germanium samples 30 mm in diameter was produced, the resistivity of the samples was equal 4, 8, 12, 16,…., 40 Ohmcm. Certification of all samples by 8 electrical and optical parameters important for practical use of optical germanium was made. The certificated etalons of optical germanium single crystals created as well as the method of express measurements of integral dispersion developed may be used for certification of germanium crystals used for manufacturing optical elements for different branches of technique and medicine. Product Description popup.authors popup.nrat_date 2020-04-02 Close