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Information × Registration Number 0208U006494, 0106U000220 , R & D reports Title Surface processes and technology of semiconductor structures for IR-technique devices popup.stage_title Head Freik Dmytro Myhajlovych, Registration Date 09-12-2008 Organization Precarpathian university named after Vassyl Stefanyk popup.description2 Thin films of AIVBVI compounds are perspective for creation on their basis of active elements micro- and optoelectronics (detectors and radiation sources in infra-red area of an optical spectrum) and thermoelectric converters of energy for temperatures 500-850 K. The researches have given the chance to establish the nature and the general laws of charge carriers scattering in thin semi-conductor films lead chalkogenides. At the first in bulk crystals, inter-phase and inter-grain boundaries and disslocations of discrepancies the influence of scattering mechanisms is divided into the kinetic phenomena in monocrystals, mosaic and poly-crystal films of lead chalkogenides. There are explain the processes of p-n- structures formation on interphase boundaries. It is shown, that surface scattering dominates in thin monoblock films up to thickness about 0,5 microns, at the subsequent growth of a thickness the dislocation discrepancy scattering starts to prevail. Product Description popup.authors popup.nrat_date 2020-04-02 Close