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Information × Registration Number 0211U001451, 0110U004509 , R & D reports Title High resolution Raman, nanoprobe and radiospectroscopical diagnostic of morfological, componential, structural and electrophysical properties of various nanostructures: carbonic, semiconducting, composite, colloidal and biological. popup.stage_title Head Prokopenko Igor V.; Valakh M. Ya., Registration Date 03-02-2011 Organization Institute of Semiconductor Physics of National Academy of Sciences of Ukrain popup.description2 Using atomic force microscopy and confocal Raman scanning spectroscopy the structural, morphological and Raman spectra of single and multilayer SiGe nanostructures have been mapped with nanometer and submicron spatial resolution. It was shown that final morphology of self-formed nanostructure is determined by the kinetic of interdiffusion processes stimulated by deformations and total volume of nano-islands could exceed the volume of deposited germanium in several times. Product Description popup.authors Валах М.Я. Литвин П.М. Ніколенко А.С. Прокопенко І.В. Стрельчук В.В. popup.nrat_date 2020-04-02 Close