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Information × Registration Number 0213U002724, 0111U002932 , R & D reports Title Technological bases of receipt well-organized nanostructures on the surfaces of probes for an atomic-force microscopy popup.stage_title Head Vaschenko Vyacheslav Andreevich, Доктор технічних наук Registration Date 05-02-2013 Organization Cherkasy State Tehnological University popup.description2 A purpose of work is a receipt by the method of a thermal vacuum besieging of thin-films on dielectric probes with the further cathode-ray forming on its well-organized nanostructures for the increase of mechanical, chemical and operating descriptions of its probes, as measuring instrument for nanodiagnostics of surfaces. As a result of implementation of work it was the worked out methodology and algorithm of determination of time of faultless exploitation of silicic probes for АFМ, it are based on the worked out experimentally-statistical model with bringing in of method of planning of twofactor experiment, the optimal modes are certain at that the low-energy beam-processing of silicic probes of brand of Ultrasharp CSC12 was conducted at that it is an increase of its technical and operating descriptions, capacity and extends the range of measuring parameters on 15...20%; the combined methodology of receipt of thin and ultrathin coverages is improved on dielectric probes; technical and operating descriptions are investigational the methods of electronic and atomic-force microscopy, chemical firmness of instrument for the nanometrical measuring with the well-organized nanostructures formed on them. Keywords: dielectric probes, thermal vacuum besieging, band electronic stream, well-organized nanostructure, atomic-force microscopy. Product Description popup.authors Білокінь Світлана Олександрівна Бондаренко Максим Олексійович Бутенко Дмитро Володимирович Бутенко Тетяна Іванівна Ващенко Вячеслав Андрійович Канашевич Георгій Вікторович Коваленко Юрій Іванович Котляр Олександр Вікторович Куриленко Павло Іванович Петльований Петро Вікторович Рудь Максим Петрович Чепурна Оксана Миколаївна Шадхін Володимир Юхимович Яценко Ірина Вячеславівна popup.nrat_date 2020-04-02 Close