Registration Number
0213U004618,
0113U005489
, R & D reports
Title
The development of methods for nano-diagnostics of thin-film layered systems on the basis of structure-sensitive X-ray spectroscopy with using synchrotron radiation
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Head
Fodchuk Igor Mykhaylovych, Доктор фізико-математичних наук
Registration Date
19-12-2013
Organization
Yuri Fedkovych Chernivtsi National University
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A method for determining the local deformations in crystals with diffraction pictures of back reflected electrons ( pictures Kikuchi ) using the histogram method and two-dimensional discrete Fourier transform. Defined anisotropy in the distribution of local deformations on the surface of the diamond samples obtained by the temperature gradient in the system Fe-Al-C and by extension among the Mg-C + boron on the surface of a single crystal diamond synthesis static (Ni-Mn-C). The methods of determining the components of the strain tenzometra Multiwave diffraction Reninhera . Past studies of quantitative diagnostics of structural changes of defect formation and characteristics of reflection and diffraction curves izodyfuznyh intensity maps obtained by diffraction of multi multichip after ion implantation of high- nitrogen in the film Iron -Garnet
Product Description
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Борча Мар'яна Драгошівна
Гуцуляк Іван Іванович
Довганюк Володимир Васильович
Кладько Василь Петрович
Литвин Петро Мар'янович
Ткач Василь Миколайович
Федорцов Дмитро Георгійович
Фодчук Ігор Михайлович
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2020-04-02
