1 documents found
Registration Number

0213U006648, 0113U005489 , R & D reports

Title

The development of methods for nano-diagnostics of thin-film layered systems on the basis of structure-sensitive X-ray spectroscopy with using synchrotron radiation

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Head

Fodchuk Igor Mykhaylovych, Доктор фізико-математичних наук

Registration Date

20-12-2013

Organization

Yuri Fedkovych Chernivtsi National University

Description

Proposed new ways of defining a planar distribution of local deformations in crystals of diffraction patterns reflected back E (paintings Kikuchi) using the histogram method and the discrete two-dimensional Fourier-transformation. Learned the correlation between changes in the fine structure lines and multiwavelength areas on Kikuchi patterns with structural features of crystals of different origin

Product Description

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Борча Мар'яна Драгошівна
Гуцуляк Іван Іванович
Довганюк Володимир Васильович
Кладько Василь Петрович
Литвин Петро Мар'янович
Ткач Василь Миколайович
Федорцов Дмитро Георгійович
Фодчук Ігор Михайлович

R & D report
The development of methods for nano-diagnostics of thin-film layered systems on the basis of structure-sensitive X-ray spectroscopy with using synchrotron radiation
Head: Fodchuk Igor Mykhaylovych. The development of methods for nano-diagnostics of thin-film layered systems on the basis of structure-sensitive X-ray spectroscopy with using synchrotron radiation. Yuri Fedkovych Chernivtsi National University. № 0213U006648
1 documents found

Updated: 2024-09-01


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