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Information × Registration Number 0213U006648, 0113U005489 , R & D reports Title The development of methods for nano-diagnostics of thin-film layered systems on the basis of structure-sensitive X-ray spectroscopy with using synchrotron radiation popup.stage_title Head Fodchuk Igor Mykhaylovych, Доктор фізико-математичних наук Registration Date 20-12-2013 Organization Yuri Fedkovych Chernivtsi National University popup.description2 Proposed new ways of defining a planar distribution of local deformations in crystals of diffraction patterns reflected back E (paintings Kikuchi) using the histogram method and the discrete two-dimensional Fourier-transformation. Learned the correlation between changes in the fine structure lines and multiwavelength areas on Kikuchi patterns with structural features of crystals of different origin Product Description popup.authors Борча Мар'яна Драгошівна Гуцуляк Іван Іванович Довганюк Володимир Васильович Кладько Василь Петрович Литвин Петро Мар'янович Ткач Василь Миколайович Федорцов Дмитро Георгійович Фодчук Ігор Михайлович popup.nrat_date 2020-04-02 Close
R & D report
The development of methods for nano-diagnostics of thin-film layered systems on the basis of structure-sensitive X-ray spectroscopy with using synchrotron radiation
Head: Fodchuk Igor Mykhaylovych. The development of methods for nano-diagnostics of thin-film layered systems on the basis of structure-sensitive X-ray spectroscopy with using synchrotron radiation. (popup.stage: ). Yuri Fedkovych Chernivtsi National University. № 0213U006648
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Updated: 2026-03-10


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