Registration Number
0213U006648,
0113U005489
, R & D reports
Title
The development of methods for nano-diagnostics of thin-film layered systems on the basis of structure-sensitive X-ray spectroscopy with using synchrotron radiation
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Head
Fodchuk Igor Mykhaylovych, Доктор фізико-математичних наук
Registration Date
20-12-2013
Organization
Yuri Fedkovych Chernivtsi National University
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Proposed new ways of defining a planar distribution of local deformations in crystals of diffraction patterns reflected back E (paintings Kikuchi) using the histogram method and the discrete two-dimensional Fourier-transformation. Learned the correlation between changes in the fine structure lines and multiwavelength areas on Kikuchi patterns with structural features of crystals of different origin
Product Description
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Борча Мар'яна Драгошівна
Гуцуляк Іван Іванович
Довганюк Володимир Васильович
Кладько Василь Петрович
Литвин Петро Мар'янович
Ткач Василь Миколайович
Федорцов Дмитро Георгійович
Фодчук Ігор Михайлович
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2020-04-02
