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Information × Registration Number 0213U007187, 0108U003196 , R & D reports Title Development and creation of high resolution X-ray methods and equipment for the certification of nanomaterials popup.stage_title Head Machulin Volodymyr Fedorovich, Kladko Vasyl Petrovych, Registration Date 18-04-2013 Organization Institute of Semiconductor Physics of National Academy of Sciences of Ukrain popup.description2 Theoretic and experimental bases of complex methodic for control of structural parameters of quantum-sizes objects placed in the crystalline and amorphous matrices and micro- and nanoelectronic devices have been developed. For control of structural parameters of thin solid films (crystal and amorphous) reflectometry methods were developed and approbated. Laboratory of X-ray diagnostic of materials, planar structures and devices of modern technologies had been created. Product Description popup.authors Єфанов Олександр Миколайович Гудименко Олександр Йосипович Кучук Андріан Володимирович Проскуренко Наталя Миколаївна Садова Тетяна Володимирівна Сафрюк Надія Володимирівна Слободян Микола Васильович Стадник Олександр Анатолійович popup.nrat_date 2020-04-02 Close