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Information × Registration Number 0214U001030, 0113U004863 , R & D reports Title High-resolution X-ray diagnosis of 1-dimensional planar GaN nanostrutures on silicon substrates popup.stage_title Head Kuchuk Andrian Volodimirovich, Registration Date 15-01-2014 Organization Institute of Semiconductor Physics of National Academy of Sciences of Ukrain popup.description2 The results of studies using X-ray high-resolutioni diffraction structural perfection of epitaxial GaN structures grown on Si (111) substrate are presented. Regularities of distribution of deformations and changes in the density of edge and screw dislocations, depending on the thickness of the buffer layer. Product Description popup.authors Поліщук Юлія Олегівна Станчу Григорій Вікторович popup.nrat_date 2020-04-02 Close
R & D report
High-resolution X-ray diagnosis of 1-dimensional planar GaN nanostrutures on silicon substrates
Head: Kuchuk Andrian Volodimirovich. High-resolution X-ray diagnosis of 1-dimensional planar GaN nanostrutures on silicon substrates. (popup.stage: ). Institute of Semiconductor Physics of National Academy of Sciences of Ukrain. № 0214U001030
1 documents found

Updated: 2026-03-20


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