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Information × Registration Number 0214U002254, 0113U000225 , R & D reports Title Origination of the scanning probe microscopy laboratory popup.stage_title Head Prokopenko Igor, Registration Date 27-01-2014 Organization Institute of Semiconductor Physics of National Academy of Sciences of Ukrain popup.description2 Techniques for calibration of the AFM probes force constants were developed and tested. Different physical approaches, both stationary and dynamic modes, used. A corresponding analysis of measurement uncertainties and calibration of sets of AFM probes with elastic constants in the range of 0.2 - 50 N / m fulfilled. Product Description popup.authors Єфремов О.О. Корчовий А.А. Литвин О.С. Литвин П.М. Прокопенко І.В. popup.nrat_date 2020-04-02 Close