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Information × Registration Number 0214U003952, 0108U004832 , R & D reports Title Development and creation of the systems for diagnostics of materials for silicon photo-converters popup.stage_title Head Prokhorovich Anatolyi, Доктор фізико-математичних наук Registration Date 19-03-2014 Organization Institute of Semiconductor Physics of National Academy of Sciences of Ukrain popup.description2 A set of techniques for the measurement of parameters of Si and raw materials using for "solar" silicon and Si-based photoconverters fabrication have been developed. The methodology is created for investigations during the technological routes of Si and Si-based photoconverters, as well as the full set of the equipment for quantitative analisis. The range of testing impurity mass is of 1 to 250. Concentration range: from 10-5 - 10-3 at % (depending on the element) to 100 at.%.5481 Product Description popup.authors Калістий Г.В. Мельник В.П. Оберемок О.С. Попов В.Г. Попова В.Е. Прохорович А.В. Романюк Б.М. Федулов В.В. Хацевич І.М. popup.nrat_date 2020-04-02 Close