Registration Number
0214U003952,
0108U004832
, R & D reports
Title
Development and creation of the systems for diagnostics of materials for silicon photo-converters
popup.stage_title
Head
Prokhorovich Anatolyi, Доктор фізико-математичних наук
Registration Date
19-03-2014
Organization
Institute of Semiconductor Physics of National Academy of Sciences of Ukrain
popup.description2
A set of techniques for the measurement of parameters of Si and raw materials using for "solar" silicon and Si-based photoconverters fabrication have been developed. The methodology is created for investigations during the technological routes of Si and Si-based photoconverters, as well as the full set of the equipment for quantitative analisis. The range of testing impurity mass is of 1 to 250. Concentration range: from 10-5 - 10-3 at % (depending on the element) to 100 at.%.5481
Product Description
popup.authors
Калістий Г.В.
Мельник В.П.
Оберемок О.С.
Попов В.Г.
Попова В.Е.
Прохорович А.В.
Романюк Б.М.
Федулов В.В.
Хацевич І.М.
popup.nrat_date
2020-04-02
