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Information × Registration Number 0214U008422, 0110U004656 , R & D reports Title Development of method and equipment for X-ray ultra-acoustic express multiparametric diagnostics of nanosystems. popup.stage_title Head Olikh Jaroslav Mykhaylovych, Registration Date 23-12-2014 Organization Institute of Semiconductor Physics of National Academy of Sciences of Ukrain popup.description2 Theoretical model of X-ray-ultrasonic integral dynamical diffractometry in Laue geometry in thick crystals ( in case of anomal penetration of incident and diffuse X-ray waves) is created. This model is self-consistently and take into account the influence of diffuse scattering integral intensity of diffraction and its dependence on the characteristics of ultrasonic waves. Experimental laboratory of X-ray-ultrasonic diffractometry on base of center for certification of nonamaterials and devices. Product Description popup.authors Єфанов Олександр Миколайович Гудименко Олександр Йосипович Кривий Сергій Борисович Кучук Андріан Володимирович Максименко Зоя Василівна Проскуренко Наталія Миколаївна Сафрюк Надія Володимирівна Слободян Микола Васильович Стадник Олександр Анатолійович Станчу Григорій Вікторович popup.nrat_date 2020-04-02 Close