Registration Number
0217U000491,
0115U001556
, R & D reports
Title
The device for preparing of non-conductive and composite materials samples for transmission electron microscopy
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Head
Sergiy Firstov, Доктор фізико-математичних наук
Registration Date
07-02-2017
Organization
Frantzevich Insitute for Materials Science Problems of the Ukranian National Academy of Sciences
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The ion polisher for specimen preparation for transmission electron microscopy has been designed and manufactured. Operation and control of the ion poliser work is carried out by computer. Modulated rotation of the stage is required for "cross-section" damage free preparation of sample. To replace a sample the stage moves out of the working chamber of ion polisher in the lock chamber without allowing air to leak into the working chamber. There are two high voltage sources for each ion gunin the high-voltage box. Working voltage on the electrodes of the ion gun is 3 to 4 kV. A high voltage source varies 100V - 8 kV, ion current densityreaches10 mA/cm2.5481
Product Description
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Даниленко М.І.
Котко А.В.
Фірстов С.О.
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2020-04-02
