Registration Number
0217U004413,
0116U004753
, R & D reports
Title
Electronic, magnetic, microwave and optical properties of micro-and nanostructures on the surface of semiconductors and dielectrics.
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Head
Nahodkin Nikolay,
Registration Date
02-02-2017
Organization
Taras Shevchenko Kiev University
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Purpose of reserch - to study the physical properties of micro- and nanoscale structures on the surfaces of semiconductors and dielectrics, especially the formation of these structures with predetermined properties and study the possibility of using these structures for the development and improvement of advanced energy-saving technologies and functional devices and electronics. The changes in electronic and emission photocathode properties based on multilayer structure Si-Gd2O3 were studied. It was shown, that electronic and emission properties of photocathode depend on changes of localized states and defects of its surface layers. The properties of structures, which are formed by adsorption of oxygen on Si (001) surface with pre-adsorbed atoms of transition metals Cr and Mn were studied. It was determined, that phosphorus doping significantly affects on the structure of amorphous-crystalline silicon films. The effect of ultraviolet radiation on response of weakly sensitive nanosized ITO film gas sensors to the alcohol vapor was studied. The ways of optimization of sensitivity of the sensors were proposed. The method of measuring frequency of microwave signal based on the system consisting of two independent spintronic microwave magnetic detectors, which significantly reduces measurement error, was proposed. The phase synchronization criterion of two weakly coupled magnetic nanooscillators was improved. The threshold of parametric excitation of spin waves in macroscopic two-layer sample YIG / Pt by Brilluen light scattering and microwave spectroscopy methods was measured. There were observed the changes in the YIG damping due to the spin Hall’s effect and spin-torque effect when dc current passes through the Pt film. A computer model of multiple scattering of coherent optical beams was developed. The method of measuring the optical transfer function of the scattering medium by scanning the focus of the coherent light beam was proposed.
Product Description
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Афанасьєва Т.В.
Голобородько А.В,
Горячко А.В.
Данько В.П.
Коблянський Ю.В.
Коваленко А.В.
Коваль І.П.
Котов М.М.
Кулик С.П.
Курашов В.Н.
Лушкін О.Є.
Мелков Г.А.
Мельник П.В.
Мойсеєнко В.А.
Прокопенко О.В.
Родіонова Т.В.
Слободянюк Д.В.
Телега В.М.
Федорченко М.І.
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2020-04-02
