Registration Number
0217U007002,
0117U003720
, R & D reports
Title
Investigation of magnetic relaxation in nanostructures with an antiferromagnetic component: thickness dependence of the dissipation parameter
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Head
Tovstolitkin O, Доктор фізико-математичних наук
Registration Date
20-12-2017
Organization
Institute of magnetism NASU and MESU
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Thin-film multilayers ferromagnetic/nonmagnetic/antiferromagnetic (FM/NM/AFM) have been investigated by the use of ferromagnetic resonance (FMR) technique. The dissipation parameter related to the spin-pumping effect is evaluated and characterized in dependence on the thickness of both the FM layer and NM layer. Product of the dissipation parameter by FM magnetic moment is revealed to be constant for the sample series with different thicknesses of the FM layer, but exhibits a considerable thickness dependence for the sample series with different thicknesses of the NM layer. The results are explained by different character of spin-mixing conductance at the FM/NM interface.
Product Description
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Кравець А.Ф.
Невдача В.В.
Поліщук Д.М.
Товстолиткін О.І.
Яремкевич Д.Д.
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2020-04-02
