Registration Number
0218U002091,
0116U004753
, R & D reports
Title
Electronic, magnetic, microwave and optical properties of micro- and nanostructures on the surface of semiconductors and dielectrics.
popup.stage_title
Head
Nakhodkin Mykola,
Registration Date
18-01-2018
Organization
Taras Shevchenko Kiev University
popup.description2
Information about electronic, adsorption and structural characteristics of micro and nanostructures on semiconductor and dielectric surfaces, in particular Si-Gd-O systems; the surface of silicon (001) with adsorbed transition metals Ti, Cr, Mn; the nanostructures of periodic bending of the 2D plane g-C / Ge (111) are investigated. The studies of relative grain boundary energy in non-alloyed and doped by phosphorus silicon films with equal-sided, dendritic and fibrous structure have been carried out. The influence of optical irradiation on the properties of heterophase structures on the basis of silicon with adsorption of ammonia, alcohols and essential oils has been investigated. The phenomenon of poisoning of sensors as a result of adsorption of essential oils has been documented. The influence of ultraviolet irradiation on desorption processes is investigated. The model of the mutual phase synchronization of spintronic magnetic nanoscilators (STNO) in the approximation of the global communication for the case of an arbitrary number of nanoscilators with random eigenvalues is generalized. Numerical analysis of the processes of mutual phase synchronization for 2, 3, 5, 10, and 20-and STNO for different values of technological spread of their own parameters has been carried out. It is illustrated that due to the technological spread of the parameters of STNO the area of their guaranteed stable synchronization is narrowed. The state diagram for the stable synchronization of the STNO is calculated. The algorithm of focusing of coherent optical beams through a multiple scattering medium on the basis of a computer model of the environment using a gradient descent method is developed, and an estimation of the accuracy of the scattering modeling and determination of the transmission characteristic of the scattering medium is obtained with the limitation of the number of own channels.
Product Description
popup.authors
Афанас'єва Т.В.
Горячко А.В.
Данько В.П.
Коблянський Ю.В.
Коваленко А.В.
Коваль І.П.
Котов М.М.
Кулик С.П.
Лушкін О.Є.
Мельник П.В.
Мойсеєнко В.А.
Прокопенко О.В.
Родіонова Т.В.
Слободянюк Д.В.
Телега В.М.
Федорченко М.І.
popup.nrat_date
2020-04-02
