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Information × Registration Number 0218U002545, 0114U002268 , R & D reports Title Development and design of diagnostic complex for testing microwave diodes based on wide bandgap semiconductors popup.stage_title Head Konakova Raisa Vasil'evna, Kudryk Yaroslav Yaroslavovich, Registration Date 10-04-2018 Organization Institute of Semiconductor Physics popup.description2 The scientific and technical report consists of the introduction, the main part and conclusions. The report contains 10 pages of typed text, including 10 pages of the main text, 4 illustrations and a list of links from 6 titles. The object of the research of the performed work is the methods of diagnosing microwave diodes on the basis of wideband semiconductors. The purpose of the work is to develop a diagnostic complex for analyzing the Hann microwave diodes, p-i-n and avalanche-transmitted diodes. During the project implementation, the design, creation and testing in the experiment of a temperature regulator unit for testing microwave diodes based on broadband semiconductors was conducted. On the basis of the microcontroller ATXMega16a4, a temperature control unit was created using a proportional-integral-differential temperature control algorithm, and pulse-width (12 bit) control of the power of the heater with computer control and control of the stabilization process via USB-protocol. Product Description popup.authors Виноградов Анатолій Олегович Кудрик Ярослав Ярославович Сай Павло Олегович Сліпокуров Віктор Сергійович Шинкаренко Володимир Вікторович popup.nrat_date 2020-04-02 Close