Registration Number
0218U002545,
0114U002268
, R & D reports
Title
Development and design of diagnostic complex for testing microwave diodes based on wide bandgap semiconductors
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Head
Konakova Raisa Vasil'evna, Kudryk Yaroslav Yaroslavovich,
Registration Date
10-04-2018
Organization
Institute of Semiconductor Physics
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The scientific and technical report consists of the introduction, the main part and conclusions. The report contains 10 pages of typed text, including 10 pages of the main text, 4 illustrations and a list of links from 6 titles. The object of the research of the performed work is the methods of diagnosing microwave diodes on the basis of wideband semiconductors. The purpose of the work is to develop a diagnostic complex for analyzing the Hann microwave diodes, p-i-n and avalanche-transmitted diodes. During the project implementation, the design, creation and testing in the experiment of a temperature regulator unit for testing microwave diodes based on broadband semiconductors was conducted. On the basis of the microcontroller ATXMega16a4, a temperature control unit was created using a proportional-integral-differential temperature control algorithm, and pulse-width (12 bit) control of the power of the heater with computer control and control of the stabilization process via USB-protocol.
Product Description
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Виноградов Анатолій Олегович
Кудрик Ярослав Ярославович
Сай Павло Олегович
Сліпокуров Віктор Сергійович
Шинкаренко Володимир Вікторович
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2020-04-02
