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Information × Registration Number 0218U003441, 0115U005035 , R & D reports Title Development and creation of high-resolution X-ray methods and equipment for certification of nanomaterials popup.stage_title Head Kladko Vasyl Petrovych, Доктор фізико-математичних наук Registration Date 13-02-2018 Organization Institute of Semiconductor Physics popup.description2 Different methods of X-ray analysis of manganese doped chalcogenide glass As2Se3 have been tested. Proven software of X-ray methods for controlling the characteristics of investigated objects on objects of both crystalline and amorphous structure. The structure, size and deformation state of nanocrystals of various materials embedded in an amorphous matrix on the basis of quantum dots of CdS are investigated. The tests of developed techniques at different stages of technological processes of nanomaterials and instrumental structures on their basis have been tested. Product Description popup.authors Гудименко Олександр Йосипович Кривий Сергій Борисович Максименко Зоя Василівна Поліщук Юлія Олегівна Сафрюк Надія Володимирівна Слободян Микола Васильович Станчу Григорій Вікторович popup.nrat_date 2020-04-02 Close