Registration Number
0218U003441,
0115U005035
, R & D reports
Title
Development and creation of high-resolution X-ray methods and equipment for certification of nanomaterials
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Head
Kladko Vasyl Petrovych, Доктор фізико-математичних наук
Registration Date
13-02-2018
Organization
Institute of Semiconductor Physics
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Different methods of X-ray analysis of manganese doped chalcogenide glass As2Se3 have been tested. Proven software of X-ray methods for controlling the characteristics of investigated objects on objects of both crystalline and amorphous structure. The structure, size and deformation state of nanocrystals of various materials embedded in an amorphous matrix on the basis of quantum dots of CdS are investigated. The tests of developed techniques at different stages of technological processes of nanomaterials and instrumental structures on their basis have been tested.
Product Description
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Гудименко Олександр Йосипович
Кривий Сергій Борисович
Максименко Зоя Василівна
Поліщук Юлія Олегівна
Сафрюк Надія Володимирівна
Слободян Микола Васильович
Станчу Григорій Вікторович
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2020-04-02
