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Information × Registration Number 0220U104472, 0120U102172 , R & D reports Title New opportunities of cross-correlation scanning probe and optical diagnostics for local electrophysical, optical and magnetic properties of nanomaterials and device structures in nanophotonics, piezotronics and spintronics. popup.stage_title Head Lytvin Petro M., Кандидат фізико-математичних наук Registration Date 18-12-2020 Organization V. Lashkaryov Institute of semiconductor physics popup.description2  Non-destructive methods of nanodiagnostics have been developed, based on the methods of scanning probe microscopy and confocal optical spectroscopy; establishing the relationship between structural, topological and electrical parameters of materials, active elements of semiconductor devices, optoelectronics, micro (nano) electronics, power electronics; optimization of technologies for obtaining high-quality semiconductor nanomaterials for electronic and optoelectronic applications. Phonon and electronic excitations in local regions of III-N heterostructures have been studied. The temperature dependence of Raman spectra and PL spectra of instrumental AlGaN / GaN transistor heterostructures with high electron mobility (HEMT) under controlled thermal and Joule heating by applying operating voltages and currents has been studied. Product Description popup.authors Kolomys Oleksandr F. Korchovyi Andrii A. Lytvin Petro M. Nikolenko Andriy S. Prokopenko Igor V. Strelchuk Viktor V. popup.nrat_date 2020-12-18 Close