Registration Number
0220U104472,
0120U102172
, R & D reports
Title
New opportunities of cross-correlation scanning probe and optical diagnostics for local electrophysical, optical and magnetic properties of nanomaterials and device structures in nanophotonics, piezotronics and spintronics.
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Head
Lytvin Petro M., Кандидат фізико-математичних наук
Registration Date
18-12-2020
Organization
V. Lashkaryov Institute of semiconductor physics
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Non-destructive methods of nanodiagnostics have been developed, based on the methods of scanning probe microscopy and confocal optical spectroscopy; establishing the relationship between structural, topological and electrical parameters of materials, active elements of semiconductor devices, optoelectronics, micro (nano) electronics, power electronics; optimization of technologies for obtaining high-quality semiconductor nanomaterials for electronic and optoelectronic applications. Phonon and electronic excitations in local regions of III-N heterostructures have been studied. The temperature dependence of Raman spectra and PL spectra of instrumental AlGaN / GaN transistor heterostructures with high electron mobility (HEMT) under controlled thermal and Joule heating by applying operating voltages and currents has been studied.
Product Description
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Kolomys Oleksandr F.
Korchovyi Andrii A.
Lytvin Petro M.
Nikolenko Andriy S.
Prokopenko Igor V.
Strelchuk Viktor V.
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2020-12-18
