Fedortsov Dmytro Georgiyovich. Topography and diffractometry of silicon crystals with dislocations and microdefects under condition of X-ray acoustic resonance : к.ф.-м.н. : spec.. 01.04.07 - Фізика твердого тіла : presented. 2004-10-29; popup.evolution: .; Yuri Fedkovych Chernivtsi National University. – , 0404U004527.

Updated: 2026-11-10