1 documents found
Candidate dissertation
Safriuk Nadiia Volodymyrivna. Х-Ray characterization of multilayered systems Al(In)GaN on polar planes of sapphire.
: к.ф.-м.н. :
spec.. 01.04.07 - Фізика твердого тіла :
presented. 2012-01-18; .
Institute of Semiconductor Physics. – ,
0412U000146.
1 documents found
Updated: 2025-02-16