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Candidate dissertation
Safriuk Nadiia Volodymyrivna. Х-Ray characterization of multilayered systems Al(In)GaN on polar planes of sapphire. : к.ф.-м.н. : spec.. 01.04.07 - Фізика твердого тіла : presented. 2012-01-18; . Institute of Semiconductor Physics. – , 0412U000146.
1 documents found

Updated: 2025-02-16