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Information × Registration Number 2111U001221, Article popup.category Thesis Title popup.author popup.publication 01-01-2011 popup.source_user Сумський державний університет popup.source http://essuir.sumdu.edu.ua/handle/123456789/20616 popup.publisher Видавництво СумДУ Description Self-similar structure of the carbon thin films, obtained by magnetron sputtering is investigated numerically. Statistical parameters are calculated within two dimensional multifractal detrended fluctuation analysis. The numerical model for the surfaces under investigation was build from the SEM images of the carbon thin films. It is shown that the self-similarity in surface roughness preserves over all fragments of the sample, and through different resolutions of the SEM images. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/20616 popup.nrat_date 2025-05-12 Close