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Information × Registration Number 2114U001431, Article popup.category Стаття Title popup.author popup.publication 01-01-2014 popup.source_user Сумський державний університет popup.source http://essuir.sumdu.edu.ua/handle/123456789/37033 popup.publisher ELSEVIER Description Compositional and structural studies of Cu2ZnSnSe4 (CZTSe) thin films were carried out by X-ray diffraction, energy dispersive X-ray spectroscopy (EDS), particle induced X-ray emission (PIXE), photoluminescence, and Raman spectroscopy. CZTSe thin films with different compositions were deposited on sodalime glass by coevaporation. The composition of the filmsmeasured by two differentmethods, EDS and PIXE, showed significant differences. Generally, the Zn/Sn ratio measured by EDS is larger than that measured by PIXE. Both the micro- PIXE and the micro-Raman imaging results indicated the compositional and structural inhomogeneity of the sample. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/37033 popup.nrat_date 2025-05-12 Close