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Інформація × Реєстраційний номер 2114U001431, Матеріали видань та локальних репозитаріїв Категорія Стаття Назва роботи Composition variations in Cu2ZnSnSe4 thin films analyzed by X-ray diffraction, energy dispersive X-ray spectroscopy, particle induced X-ray emission, photoluminescence, and Raman spectroscopy Автор Дата публікації 01-01-2014 Постачальник інформації Сумський державний університет Першоджерело http://essuir.sumdu.edu.ua/handle/123456789/37033 Видання ELSEVIER Опис Compositional and structural studies of Cu2ZnSnSe4 (CZTSe) thin films were carried out by X-ray diffraction, energy dispersive X-ray spectroscopy (EDS), particle induced X-ray emission (PIXE), photoluminescence, and Raman spectroscopy. CZTSe thin films with different compositions were deposited on sodalime glass by coevaporation. The composition of the filmsmeasured by two differentmethods, EDS and PIXE, showed significant differences. Generally, the Zn/Sn ratio measured by EDS is larger than that measured by PIXE. Both the micro- PIXE and the micro-Raman imaging results indicated the compositional and structural inhomogeneity of the sample. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/37033 Додано в НРАТ 2025-05-12 Закрити