Registration Number
2118U006417, Article
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Стаття
Title
Increase of realibility of optic-electronic devices by means of finishing electron-beam processing of their optical elements (AI translated)
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Яценко Ірина В'ячеславівна
Антонюк Віктор Степанович
Гордієнко Валентин Іванович
Кириченко Оксана В'ячеславівна
Ващенко Вячеслав Андрійович
Yatsenko Iryna V'yacheslavivna
Antoniuk Viktor Stepanovych
Hordiienko Valentyn Ivanovych
Kyrychenko Oksana V'yacheslavivna
Vashchenko Vyacheslav Andriiovych
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01-01-2018
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Черкаський державний технологічний університет
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http://er.chdtu.edu.ua/handle/ChSTU/723
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Int. Sci. J. "Machines. Technologies. Materials"
Description
The range of parameters of the electron beam (density of thermal effect and travel speeds), within which there is an improvement in the performance characteristics of optical elements: increase of microhardness of the surface of elements from optical ceramics from 1,21∙10^3…2,83∙10^3 MPa to 4,84∙10^3…7,15∙10^3 MPa and increase of the spectral transmission coefficient of IR-radiation by 4... 6% for elements of optical glass and for 5... 7% – for elements of optical ceramics; there occurs an increase in the critical values of the external heat flow leading to the destruction of the elements by 1,5…2 times, thus the increase of external pressure up to 10^7 Pa decreases the specified critical values by 1,3…1,5 times; critical values of thermoelastic stresses in optical elements at heating temperatures 300... 1200 K increase by 1,5…2,5 times, indicating an increase in resistance to thermal effects and increased external pressures of optical elements processed by an electronic beam; the values of critical heights of falling of a steel ball on their surface, leading to destruction of elements, increase from 0,18…1,1 m to 0,37…1,35 m, so, their resistance to mechanical shocks increases. It is established, that increase of durability of optical elements, processed by an electron beam, to external thermal and mechanical effects leads to the increase of probability of non-failure operation of optic-electronic devices under extreme conditions of operation to 10... 20%.
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2026-04-27
