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Information × Registration Number 0214U006666, 0112U002337 , R & D reports Title Development of techniques for diagnostics of structural imperfections in nanoscale systems using data of X-ray and electron diffraction popup.stage_title Head Fodchuk Igor, Доктор фізико-математичних наук Registration Date 06-02-2014 Organization Yuri Fedkovych Chernivtsi National University popup.description2 New approaches of planar distribution of local strains in crystals from patterns of electron back-scattering diffraction (Kikuchi patterns) were proposed on the basis of using histogram method and direct two-dimension Fourier transformation. The interrelation between changes of fine structure of two-beam diffraction lines and multi-bean regions on the Kikuchi patterns and structure peculiarities of crystals of various origins was established. Structural transformations of defect system and features of formation of X-ray diffraction reflection curves and iso-diffuse intensity maps, obtained by multi-axial multi-crystal diffractometry, were characterized after high-doze implantation of nitrogen ions in yttrium-ferrum garnet. On the basis of results of magnetic force microscopy it was established that high dozes cause essential arranging magnetic domains and, consequently, improving ferromagnetic properties of films under research. Product Description popup.authors Баловсяк Сергій Васильович Борча Мар'яна Драгошівна Гуцуляк Іван Іванович Лоренц Василь Мірчевич Федорцов Дмитро Георгійович Фодчук Ігор Михайлович popup.nrat_date 2020-04-02 Close