Information × Registration Number 2103U000219, Article popup.category Стаття Title popup.author popup.publication 01-01-2003 popup.source_user Сумський державний університет popup.source http://essuir.sumdu.edu.ua/handle/123456789/1559 popup.publisher Видавництво СумДУ Description Experimental results of investigation of the strain sensitivity coefficient of the one- and three-layered Cr-, Cu- and Sc-based films are presented. The difference between strain sensitivity coefficient one- and three-layered films has explain with scattering of conductivity electrons on external and internal surfaces of separate layers and boundaries of crystalline. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/1559 popup.nrat_date 2025-03-31 Close
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published. 2003-01-01;
Сумський державний університет, 2103U000219